CIQTEK at 2026 vEM Technology Forum: High-Speed Volume EM in Focus

CIQTEK has wrapped up its participation in the 2026 vEM Technology Forum at Peking University in Beijing, where researchers and microscopy specialists gathered to discuss the latest developments in Volume Electron Microscopy, large-area imaging, automation, and 3D reconstruction.

For CIQTEK, the conversations came back to one practical challenge again and again: how to image larger biological volumes faster without giving up the resolution needed to see fine structures.

That is exactly where high-speed SEM is becoming increasingly important.

From Faster Imaging to Larger Volume EM Workflows

At the CIQTEK booth, our team introduced the HEM6000 High-Speed SEM and discussed how high imaging speed, low-kV resolution, automated large-area acquisition, and intelligent workflows can support increasingly data-intensive Volume EM research.

For researchers working with large numbers of serial sections or extended regions of interest, acquisition speed is only one part of the workflow. Stable imaging, consistent quality across large areas, and automation become equally important as datasets grow.

These topics led to many useful discussions with researchers working on biological imaging, neuroscience, connectomics, and other large-scale microscopy applications.

Sharing Our Latest Work on High-Speed SEM

During the forum, Dr. Changming Liu (Noah), CIQTEK Senior Electron Microscopy Solution Manager, presented CIQTEK's latest work on high-speed SEM for large-scale Volume EM.

The presentation highlighted how the HEM6000 combines high-speed acquisition with low-kV imaging performance, large-area imaging, and automation to make demanding Volume EM workflows more efficient.

Rather than treating speed as a standalone specification, the discussion focused on a broader question: how can faster acquisition translate into a more practical workflow for real research?

More Conversations Ahead

The 2026 vEM Technology Forum was a valuable opportunity to hear directly from the microscopy community about the challenges behind large-scale imaging and data acquisition.

Those conversations also give us a clearer view of where electron microscopy workflows are heading: larger datasets, more automation, higher throughput, and stronger demand for reliable high-resolution imaging at scale.

CIQTEK will continue developing electron microscopy solutions that help researchers move from individual high-resolution images toward more efficient, large-scale characterization workflows.

Thank you to everyone who stopped by, shared ideas, and discussed their research with us in Beijing.