CIQTEK Lists on the Shanghai STAR Market CIQTEK held its listing ceremony at the Shanghai Stock Exchange on August 11, 2026. The listing marks a new stage for the company as it continues to develop high-end scientific instruments. The company trades under stock code 688828 and develops, manufactures, and sells products including electron microscopes, electron paramagnetic resonance spectrometers, and nuclear magnetic resonance spectrometers. Listing Information CIQTEK issued 40.0100 million shares at RMB 21.22 per share. The gross proceeds from the new share offering were RMB 849.0122 million. Following the offering, the company had 400.0100 million shares outstanding. In 2025, CIQTEK reported revenue of RMB 666.191845 million. The company is based in Hefei, Anhui Province.   From Research to Real-World Use CIQTEK focuses on turning research capabilities into instruments that can be used in laboratories and industrial settings. At the ceremony, Dr. He Yu, Chairman of CIQTEK, said the listing is an important milestone and a stage in the company’s journey from the laboratory to real-world use. Dr. He thanked customers, partners, investors, and the teams that supported the offering and listing process. A Focus on Useful, Reliable Instruments CIQTEK develops high-end scientific instruments across several product areas. The company continues to invest in research and development and to expand its product portfolio around customer needs. Dr. He said that customer feedback, technical problem-solving, and reliable delivery are central to the company’s long-term improvement. CIQTEK will continue to advance projects funded by the offering and strengthen transparent, standardized governance. Looking Ahead Dr. He noted that better measurement tools support scientific discovery and that high-quality data remains essential as artificial intelligence changes the way research is done. CIQTEK will continue to build instruments for researchers and industrial users around the world. “We will stay focused, keep improving over the long term, and move forward steadily,” Dr. He said in closing.   Reprint Note The opening and “Listing Information” sections are reprinted from a Shanghai Stock Exchange public release. The remaining sections are adapted from an original address by Dr. He Yu, Chairman of CIQTEK, delivered at the listing ceremony.

El microscopio electrónico de barrido con haz de iones focalizado (FIB-SEM) de doble haz CIQTEK DB550 combina la obtención de imágenes electrónicas de alta resolución y el procesamiento de precisión mediante haz de iones en una única plataforma. CIQTEK ha validado su Microscopio electrónico de barrido con haz de iones focalizado DB550 (FIB-SEM) en muestras reales de chips de nodo de proceso de 5 nm, Se demuestra la preparación de muestras TEM listas para producción, con estructuras de aletas intactas, cero amorfización y capas de película claramente definidas. Los resultados confirman que el DB550 cumple con las exigentes demandas de los laboratorios avanzados de análisis de fallas de semiconductores que trabajan a la vanguardia de la tecnología de procesos. En la investigación y fabricación de chips avanzados, dos herramientas son fundamentales. El microscopio electrónico de transmisión (TEM) permite observar estructuras a escala atómica. Pero antes de poder hacerlo, se necesita una muestra lo suficientemente delgada para que los electrones la atraviesen. Aquí es donde entra en juego el FIB-SEM de doble haz. Es el laboratorio de precisión que prepara esas muestras ultrafinas. Presentamos el DB550: una plataforma para imágenes y procesamiento a nanoescala. El CIQTEK DB550 FIB-SEM Integra dos potentes capacidades en una única plataforma. Por un lado, un microscopio electrónico de barrido (SEM) proporciona imágenes de superficie de alta resolución. Por otro, un haz de iones focalizado (FIB) realiza la eliminación de material a nanoescala con precisión quirúrgica. Juntas, salvan la distancia entre la observación y la fabricación en dimensiones que se miden en milmillonésimas de metro. En el corazón del DB550 se encuentra un columna de electrones de bajo voltaje y alta resolución combinado con la tecnología patentada de CIQTEK Columna iónica "Changying" Desarrollada íntegramente en la empresa, la columna Chengying es el motor que impulsa las capacidades de corte y grabado a nanoescala del sistema. CIQTEK controla todo el proceso de diseño y fabricación de este componente fundamental. El desafío de los 5 nm: por qué la preparación de muestras se vuelve más difícil con cada nodo En 5 nm y menores Las arquitecturas de chips se basan en transistores de efecto de campo de tipo aleta (FinFET) con anchos y pasos de aleta que se miden en tan solo unos pocos nanómetros. El DB550 está diseñado para manejar todo el flujo de trabajo de preparación de muestras para estos exigentes nodos de proceso. Comienza con corte basto de alta corriente para eliminar rápidamente el material a granel y llegar a la región objetivo. Luego pasa a pulido fino de bajo voltaje para adelgazar la muestra hasta alcanzar las dimensiones adecuadas para su observación mediante microscopía electrónica de transmisión (TEM) sin dañar las delicadas estructuras subyacentes. Validación TEM: La prueba está en la imagen. CIQTEK Se preparó una muestra de chip con un proceso de fabricación de 5 nm ...

A Winning Team: SEM + FIB, the "Golden Combination" CIQTEK brings SEM and FIB together as a powerful team, providing critical support for PCB process optimization, reliability verification, and root cause determination of failures. SEM High-Resolution Imaging: The "Microscope" for Surface Details The SEM uses a high-resolution electron beam to capture crisp images of PCB surface morphology. It reveals solder pad plating, intermetallic compounds, micro-cracks, tin whiskers, and foreign particle contamination with exceptional clarity. Coupled with energy-dispersive X-ray spectroscopy (EDS), the SEM also performs elemental analysis on microscopic regions. This combination lets engineers identify the chemical signature of defects, making it straightforward to spot issues like short circuits, open circuits, corrosion, and plating anomalies. FIB Nanoscale Cutting: The "Scalpel" for Internal Structures While the SEM excels at surface imaging, the FIB takes over when you need to see what is happening inside the board. Using a nanometer-precision ion beam, the FIB performs targeted cross-sectioning at the exact defect location. It prepares ultra-thin slices through multi-layer boards, blind vias, and buried vias, exposing internal structures that mechanical sectioning simply cannot reach. Think of the FIB as a microscopic surgical tool. It removes material with nanometer accuracy, leaving a clean cross-section ready for imaging and analysis. CIQTEK Semiconductor Showcase: See It in Action The Beauty of the Microscopic World, Revealed in Every Detail. Here are real examples of CIQTEK electron microscopes in PCB cross-section observation: Solder Joint Interface Panorama Low magnification observation of capacitor overall morphology, viewing the real microscopic structure of the capacitor solder joint interface from the inside IMC Layer Evaluation Evaluating interlayer bonding, measuring IMC thickness and uniformity, detecting voids, cracks, and interface defects Multi-Layer Board Inner Structure Clear observation of IMC layer morphology, thickness, continuity, and density at the solder pad and solder interface Process Reliability Evaluation Evaluating trace pattern, thickness, etching quality and copper-to-substrate bonding, detecting line shift, etch defects, delamination, voids, and analyzing plating layer quality for PCB process control and reliability assessment Built for Labs That Demand Reliability CIQTEK develops its electron microscopy platforms from the ground up, covering core algorithms through hardware design. This vertical integration ensures consistent performance and long-term supply stability, which matters for labs running continuous production or multi-year research programs. The company backs its instruments with responsive technical support and regular software updates, helping users keep their systems running efficiently over time. Get in Touch If you are evaluating SEM or FIB systems for your PCB inspection workflow, the CIQTEK team can...