CIQTEK has officially launched its 200 kV field emission transmission electron microscope, TEM-F200, delivering 0.10 nm information resolution and featuring several key subsystems developed in-house. Unveiled on October 18 at the 2026 National Electron Microscopy Annual Conference in China, the TEM-F200 is designed for demanding work in materials science, semiconductor research, and nanoscale characterization. The launch also marks another step toward a more complete domestic TEM platform, from key hardware to imaging and analysis workflows. Built Around Resolution, Stability, and Practical Use For TEM users, resolution is only part of the story. Stability, ease of operation, detector performance, automation, and service all affect what the microscope can actually deliver day-to-day. The TEM-F200 combines a 200 kV field emission electron source with a self-developed high-voltage power supply and optical system. TEM-F200 Key Specifications 200 kV Field Emission Transmission Electron Microscope Acceleration Voltage 20 to 200 kV Information Resolution 0.10 nm Point Resolution 0.25 nm STEM Resolution 0.16 nm STEM Detector Modes HAADF, ADF, ABF Magnification 20× to 1,200,000× Super-EDS Optional dual 100 mm² windowless SDD detectors with symmetrical geometry, energy resolution ≤127 eV Optional Configurations EELS, 4D-STEM, 3D-ED, in situ sample holder A thermostatic water-cooled objective lens and four-axis sample stage help support stable imaging, while automated aperture control, position memory, and one-click adjustment are designed to reduce repetitive manual work. The main imaging camera is CIQTEK’s self-developed 16-megapixel fiber-coupled CMOS camera, built specifically for TEM use. The camera combines a 9 μm CMOS sensor, 4K × 4K imaging, and up to 24 fps at full resolution. Less Time at the Controls, More Time on the Sample The TEM-F200 also puts a strong focus on workflow. Fluorescent-screen images can be transferred directly to the PC display, while high-voltage control, electron-gun auto-start, vacuum operation, sample-position auto navigation, and STEM detector movement can all be integrated into the system workflow. For laboratories that need more flexibility, the platform can also be expanded with EDS, EELS, 4D-STEM, 3D electron diffraction, side cameras, cryogenic components, and in situ holders. From FinFET Devices to Advanced Alloys The new system has already been demonstrated on a range of demanding samples. For semiconductor FinFET devices, local nanoscale features and fine lattice structures were clearly resolved, with FFT analysis showing a spacing down to 1.045 Å. Semiconductor FinFET Cross-sectional imaging of semiconductor memory chips clearly revealed multilayer thin-film and dielectric structures. For 7075 aerospace aluminum alloy, TEM-BF and STEM-HAADF imaging resolved nanoscale precipitates, discontinuous grain-boundary phases, and precipitate-free zones. The system was also used to e...

CIQTEK officially unveiled its self-developed TEM-F200 200 kV Field Emission Transmission Electron Microscope at the 2026 National Annual Conference on Electron Microscopy in Nanjing, China. The TEM-F200 was the headline launch among five new electron microscopy products introduced during the event. The new lineup also includes the TEM-F120 120 kV Field Emission TEM, SEM5000Ultra Ultra-High-Resolution Field Emission SEM, a purpose-built fiber-coupled CMOS camera for TEM, and CIQTEK SEM Agent. Together, the launches expand CIQTEK's electron microscopy portfolio from complete microscope systems to imaging hardware and intelligent software. A New 200 kV TEM Developed In-House On October 18, CIQTEK Vice President Dr. Cao Feng introduced the TEM-F200 during a conference presentation focused on the development of CIQTEK's 200 kV transmission electron microscopy technology. The system reaches an information resolution of 0.10 nm. Key components, including the high-voltage power supply, electron gun, constant-power water-cooled objective lens, fully automated apertures, and fiber-coupled CMOS camera, were developed in-house. The TEM-F200 is now ready for volume production and delivery. The launch marks an important step in CIQTEK's expansion into higher-end transmission electron microscopy and strengthens its ability to develop complete electron microscopy systems around core technologies. Five New Products Across TEM, SEM, Imaging and AI Alongside the TEM-F200, CIQTEK introduced four additional products covering different parts of the electron microscopy workflow: TEM-F120, a 120 kV Field Emission Transmission Electron Microscope SEM5000Ultra, an Ultra-High-Resolution Field Emission Scanning Electron Microscope A purpose-built fiber-coupled CMOS camera for TEM CIQTEK SEM Agent, an intelligent software platform for electron microscopy These launches extend beyond individual instruments. They cover complete TEM and SEM systems, core imaging components, and AI-powered software, showing a broader approach to electron microscopy development.   From New Instruments to Smarter Microscopy Workflows During the 2026 National Annual Conference on Electron Microscopy, CIQTEK also hosted a series of product sessions covering its TEM portfolio, the new SEM5000Ultra and wider SEM lineup, as well as its AI electron microscopy roadmap and SEM Agent platform. The focus was not simply on adding more instruments. As microscopy workflows become more complex, users increasingly need a combination of high-resolution imaging, stable hardware, automation, and easier operation. By developing complete microscopes, core components, and intelligent software together, CIQTEK is building a more connected electron microscopy platform for materials science, semiconductor research, life science, and other advanced applications.   Expanding CIQTEK's Electron Microscopy Platform CIQTEK also worked with seven industry partners during the conference to showcase technologies and ap...

Para el análisis estructural de moléculas orgánicas complejas y productos naturales, experimentos de RMN de correlación escalar homonuclear 2D se encuentran entre las herramientas más útiles para resolver ambigüedades causadas por la superposición de señales en espectros 1D. Entre los más utilizados 1H-1H experimentos de correlación, COSY y TOCSY responden a dos preguntas diferentes pero complementarias. COSY se utiliza principalmente para rastrear la conectividad local protón-protón a través de acoplamientos J observables, mientras que TOCSY extiende la transferencia de magnetización a través de una red de acoplamiento continua y ayuda a identificar todos los miembros observables del mismo sistema de espín. En términos prácticos, COSY ayuda a responder "¿Qué protones están acoplados entre sí?", mientras que TOCSY ayuda a responder "¿Qué protones pertenecen al mismo sistema de espín?" Este artículo recorre los dos experimentos desde los principios de la secuencia de pulsos hasta la interpretación práctica del espectro, explicando sus diferencias clave y cómo pueden utilizarse juntos en espectroscopia de RMN 2D. 1. Funciones principales de COSY y TOCSY COSY, o espectroscopia de correlación, y TOCSY, o espectroscopia de correlación total, ambos utilizan acoplamiento escalar, o acoplamiento J, para proporcionar información de correlación de protones a través de enlaces químicos. Sin embargo, el tipo de información estructural que están diseñados para revelar es diferente. Considere una cadena de protones continuamente acoplada: H1 → H2 → H3 → H4 COSY: Conectividad de acoplamiento local COSY detecta principalmente acoplamientos escalares directamente observables entre pares de protones. Las correlaciones más comunes surgen de 2JHH y 3JHH acoplamientos, por ejemplo: H1 ↔ H2H2 ↔ H3H3 ↔ H4 Estas correlaciones por pares permiten a los investigadores construir la conectividad protónica local paso a paso. En otras palabras, un espectro COSY es particularmente útil cuando el objetivo es reconstruir la relación secuencial entre protones vecinos o acoplados de forma detectable. Nota: Las correlaciones COSY no se limitan a acoplamientos de dos y tres enlaces. En sistemas alílicos, sistemas aromáticos o geometrías rígidas tipo W, un acoplamiento 4J suficientemente fuerte, típicamente mayor a aproximadamente 1.5 Hz, también puede generar un pico cruzado COSY. Por lo tanto, la presencia de un pico cruzado por sí sola no debe tomarse como prueba de que dos núcleos son directamente adyacentes en la estructura molecular. TOCSY: Asignación de un sistema de espín completo TOCSY adopta un enfoque diferente. Mediante la transferencia de magnetización a través de una red acoplada por J, los protones dentro del mismo sistema de espín continuo pueden correlacionarse incluso cuando dos protones particulares no muestran un acoplamiento directo fuerte entre sí. Por lo tanto, su objetivo principal no es determinar la conectividad directa de cada par de protones. En cambio, TOC...