TEM de emisión de campo | TH-F120

Microscopio electrónico de transmisión de emisión de campo (TEM) de 120 kV 1. Espacios de trabajo divididos: Los usuarios operan TEM en una habitación dividida con comodidad, lo que reduce la interferencia ambiental con TEM. 2. Alta eficiencia operativa: El software designado integra procesos altamente automatizados, lo que permite una interacción TEM eficiente con monitoreo en tiempo real. 3. Experiencia operativa mejorada: Equipado con un cañón de electrones de emisión de campo con un sistema altamente automatizado. 4. Alta capacidad de expansión: Hay suficientes interfaces reservadas para que los usuarios actualicen a una configuración superior, que cumpla con diversos requisitos de aplicaciones.

Ga+ Focused Ion Beam Field Emission Scanning Electron Microscope   The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities.   The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.

High-speed Fully Automated Field Emission Scanning Electron Microscope Workstation   CIQTEK HEM6000 facilities technologies such as the high-brightness large-beam current electron gun, high-speed electron beam deflection system, high-voltage sample stage deceleration, dynamic optical axis, and immersion electromagnetic & electrostatic combo objective lens to achieve high-speed image acquisition whilst ensuring nano-scale resolution. The automated operation process is designed for applications such as a more efficient and smarter large-area high-resolution imaging workflow. Its imaging speed is over five times faster than that of a conventional field emission scanning electron microscope (FESEM).

Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM)   The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

Read the CIQTEK SEM Microscopes customer insights and learn more about CIQTEK's strengths and achievements as the SEM industry leader!   Email: info@ciqtek.com