CIQTEK Successfully Concludes Exhibition at SCANDEM 2026 in Oulu, Finland

Event Overview

CIQTEK Booth Highlights

• SEM5000X Ultra-High Resolution FESEM: CIQTEK's flagship field emission scanning electron microscope, featuring an advanced electron optical system delivering ultra-high resolution imaging, ideal for precision nano-structural analysis in materials science, semiconductors, and life sciences.
• HEM6000 High-Speed SEM: A high-throughput workstation engineered for large-area and batch inspection, with outstanding high beam current, exceptional stability, and automated workflows, significantly accelerating imaging speeds for industrial quality control and advanced research.
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Company Presentation

Key Presentation Topics

• Powerful High-Speed Imaging Technology Bundle: Integrating high brightness large beam current electron source, high-speed scanning driver, high-speed electrostatic beam deflection, high-speed image processing, high-speed signal electron acquisition, high-speed video signal transmission, high-speed motion specimen stage, and highly automated workflow — delivering faster imaging speed, longer continuous imaging hours, and intelligent workflow.
• Automatic Sample Changing System: Featuring plasma cleaner functionality for efficient sample preparation and handling.
• HEM6000 Specifications: Detailed technical parameters including resolution (1.5 nm @ 1 kV SE, 1.3 nm @ 3 kV SE, 1.5 nm @ 15 kV BSE), magnification (66× – 1,000,000×), acceleration voltage (100 V – 30 kV), sample stage capabilities, and acquisition speed (10 ns/pixel, 2×100M pixels/s).
• CIQTEK Headquarter: Located at No. 1969, Kongquetai Road, High-tech Zone, Hefei, Anhui, China. The facility covers a site area of 76,000 m² with a total floor area of 280,000 m², houses over 800 employees, and includes a 4,000 m² cleanroom (Class 10,000, partially Class 100).

European Team Support

Conclusion